IEEE Windsor Section presents “Radiation Hardened CMOS Circuits”

Abstract: Soft errors have long plagued the semiconductor field, first showing up in space applications and later in terrestrial applications. Technology scaling and low-voltage/low-power requirements are further exacerbating the occurrence of soft errors in nano-scale circuits. A soft error occurs when charge generated by energetic particles is collected by reverse-biased junctions. In this talk, we will review the background and highlight recent research done at the University of Waterloo on circuit techniques to mitigate soft errors.

Speaker: Dr. Manoj Sachdev, Professor University of Waterloo

Speaker Bio: Manoj Sachdev is a professor in electrical and computer engineering department at the University of Waterloo. His research interests include low-power and high-performance circuit design, reliability and manufacturing issues of nano-metric integrated circuits. He has written five books, has contributed to over 200 technical articles in conferences and journals. He holds more than 35 granted and pending US patents in the broad area of VLSI circuit design and test.

Location: 3000 CEI, University of Windsor

Date: Friday, November 17, 2017

Time: 10 AM EST/EDT

Please Register Here in order to attend the event

Please Contact Esrafil Jedari, Vice Chair IEEE Windsor Section for more details